unDrift: A versatile software for fast offline SPM image drift correction

• Tobias Dickbreder,
• Franziska Sabath,
• Lukas Höltkemeier,
• Ralf Bechstein and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2023, 14, 1225–1237, doi:10.3762/bjnano.14.101

• second image (Figure 4f), and the image contrast was completely lost. For drift correction, we used algorithm I based on the autocorrelation image and selected the usable part in Figure 4f manually, while the image in Figure 4e was used in its entirety. We show the drift-corrected results for both input

• calcite–water interface over a measurement time of approximately 4 h. We evaluated these images with the semi-automatic periodic analysis of unDrift (algorithm I) in approximately 1 h 40 min, which corresponds to a drift correction rate of 318 images per hour. In this series, the image contrast is rather

• , one with only a small usable part of an image, and one with an overall low image contrast and low signal-to-noise ratio. unDrift handles these three situations reliably. Moreover, we show that unDrift can be used for the fast evaluation of drift velocities and lattice parameters in long measurement

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

• the ion image contrast occur with darker patches forming in the irradiated area in the ion channeling images. A detailed discussion on channeling contrast and the effect of grain orientation on milling speed can be found in [35]. The different stages of dark patch formation are shown in Figure 5a–c

• , therefore, higher defect density and impurity concentration are expected. Throughout the experimental ion irradiation process, changes in the ion image contrast occur with darker stripes forming within the grains in the irradiated area (see Figure 5d). They cover 24% of the irradiated area. This value was

Comprehensive review on ultrasound-responsive theranostic nanomaterials: mechanisms, structures and medical applications

• Sepand Tehrani Fateh,
• Lida Moradi,
• Elmira Kohan,
• Michael R. Hamblin and
• Amin Shiralizadeh Dezfuli

Beilstein J. Nanotechnol. 2021, 12, 808–862, doi:10.3762/bjnano.12.64

• consecutive waves, amplify US signals, and eventually increase the image contrast [72][167]. In US-based drug and gene delivery systems, MBs have been used as carriers which can be loaded with a therapeutic agent and can be tracked or traced to the target site using low-intensity US imaging, and finally

Scanning transmission helium ion microscopy on carbon nanomembranes

• Daniel Emmrich,
• Annalena Wolff,
• Nikolaus Meyerbröker,
• Jörg K. N. Lindner,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18

• can be optimized either for most efficient signal collection or for maximum image contrast. The designed setup allows for the imaging of thin low-density materials that otherwise provide little signal or contrast and for a clear end-point detection in the fabrication of nanopores. In addition, the

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• ratio. Once the images were obtained, a detailed analysis was necessary to determine the origins of the image contrast. Although the recorded ∂C/∂V phase clearly indicates the type of the majority carriers detected under the tip contact, the interpretation of the ∂C/∂V amplitude is more difficult. In

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

• Jeremiah Croshaw,
• Thomas Dienel,
• Taleana Huff and
• Robert Wolkow

Beilstein J. Nanotechnol. 2020, 11, 1346–1360, doi:10.3762/bjnano.11.119

• , with both groups showing similar image contrast in STM topography (compare Figure 2i-1,2,3 with Figure 2j-1,2,3 and Supporting Information File 1, Figure S9). Their distinct location with respect to the dimer, however, is easily discerned throughout all analysis types in Figure 2i,j. In Si-tip AFM

Atomic-resolution imaging of rutile TiO₂(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy

• Daiki Katsube,
• Shoki Ojima,
• Eiichi Inami and
• Masayuki Abe

Beilstein J. Nanotechnol. 2020, 11, 443–449, doi:10.3762/bjnano.11.35

• rows are asymmetric, with the left-side rows being higher. These results show that the Ti2O3 rows of rutile TiO2(110)-(1 × 2) reconstructed surface have an asymmetric structure, and thus support the structural model by Wang et al. (Figure 1b) [24]. The image contrast in NC-AFM and STM depends on the

Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

• Yan Liu,
• Li Li,
• Xing Chen,
• Ying Wang,
• Meng-Nan Liu,
• Jin Yan,
• Liang Cao,
• Lu Wang and
• Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

• films are clearly higher than those of the unexposed regions. Figure 2k–o shows the responses of the cantilever to changes of the vibrational amplitude corresponding to cross sections of the acoustic images. Using the same resonance frequency (38.41 kHz), we observe an increase of the image contrast

Gold-coated plant virus as computed tomography imaging contrast agent

• Alaa A. A. Aljabali,
• Mazhar S. Al Zoubi,
• Khalid M. Al-Batanyeh,
• Ali Al-Radaideh,
• Mohammad A. Obeid,
• Abeer Al Sharabi,
• Walhan Alshaer,
• Bayan AbuFares,
• Tasnim Al-Zanati,
• Murtaza M. Tambuwala,
• Naveed Akbar and
• David J. Evans

Beilstein J. Nanotechnol. 2019, 10, 1983–1993, doi:10.3762/bjnano.10.195

• -D image reconstructed from the dataset of the scanned object and expressed in Hounsfield units (HU) [6]. X-ray attenuation and the image contrast result from the scattering (differential) of the X-rays in the tissue. Tissue and bones absorb X-rays more strongly than air [7]. NPs hold great potential

• contrast agents achieve their effect by increasing the relaxation rates (longitudinal relaxation rate (R1), transverse relaxation rate (R2), and pseudo-transverse relaxation rate (R2*)) of water protons in tissues through the catalysis of alignment of nuclear spins [1], thus manipulating the MR image

• contrast. This effect is known as paramagnetic relaxation enhancement [2] and is common among contrast agents containing gadolinium [3] and iron oxide nanoparticles [4]. CT is a non-invasive, diagnostic imaging tool that allows for 3-D visual reconstruction and tissue segmentation. It relies on the use of

High-throughput synthesis of modified Fresnel zone plate arrays via ion beam lithography

• Kahraman Keskinbora,
• Umut Tunca Sanli,
• Margarita Baluktsian,
• Corinne Grévent,
• Markus Weigand and
• Gisela Schütz

Beilstein J. Nanotechnol. 2018, 9, 2049–2056, doi:10.3762/bjnano.9.194

• image in Figure 3c exhibits the 21 nm wide features, which are resolved. Further analysis of the line profile taken from Figure 3c shows significant contrast for the 21 nm feature size (Figure 3d and its inset) as demonstrated by the normalized image contrast [17] value calculated from the profile plot

Optical near-field mapping of plasmonic nanostructures prepared by nanosphere lithography

• Gitanjali Kolhatkar,
• Alexandre Merlen,
• Jiawei Zhang,
• Chahinez Dab,
• Gregory Q. Wallace,
• François Lagugné-Labarthet and
• Andreas Ruediger

Beilstein J. Nanotechnol. 2018, 9, 1536–1543, doi:10.3762/bjnano.9.144

• femtosecond pulse laser, generating electron–hole pairs that are confined at the apex of the nanotriangles. The electron emission is imaged, and local variations in this emission results in an image contrast. The photoemission is strongly enhanced by the LSPR excitation at the hot spots, resulting in a higher

Nanoporous silicon nitride-based membranes of controlled pore size, shape and areal density: Fabrication as well as electrophoretic and molecular filtering characterization

• Axel Seidenstücker,
• Stefan Beirle,
• Fabian Enderle,
• Paul Ziemann,
• Othmar Marti and
• Alfred Plettl

Beilstein J. Nanotechnol. 2018, 9, 1390–1398, doi:10.3762/bjnano.9.131

• membrane thickness and the material composition as well as the etching time. The SEM image given in Figure 1h shows the cross section of typical pores in a 50 nm thick SiN membrane. To enhance the image contrast, the Cr layer was left on the membrane. Another possibility is to stop the etching process just

Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

• Daiki Katsube,
• Hayato Yamashita,
• Satoshi Abo and
• Masayuki Abe

Beilstein J. Nanotechnol. 2018, 9, 686–692, doi:10.3762/bjnano.9.63

• previous study [23]. Similarly, to the case of anatase TiO2(001), the LaAlO3(100) surface also has a periodic structure of 1.5 nm. Since the lattice constant of LaAlO3(100) is 0.379 nm, the surface was also reconstructed with (1 × 4) or (4 × 1). Details of the NC-AFM image contrast of both surfaces will be

Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert,
• Michael R. P. Ragazzon and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2018, 9, 490–498, doi:10.3762/bjnano.9.47

• slightly below and above resonance bimodal drive. It has been shown to achieve increased image contrast [17] and lead to further insights into nanomechanical properties [18]. Regardless of which particular MF-AFM method is employed, they each require the demodulation of amplitude and phase to form

Wafer-scale bioactive substrate patterning by chemical lift-off lithography

• Chong-You Chen,
• Chang-Ming Wang,
• Hsiang-Hua Li,
• Hong-Hseng Chan and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2018, 9, 311–320, doi:10.3762/bjnano.9.31

• presents a high fluorescence image contrast, which indicates sufficient space and proper molecule orientation on the platform. This observation is attributed to the incomplete contact-induced reaction resulting in alkanethiol molecule residuals in the post lift-off region, allowing for inserted molecule

• are therefore reduced with the increase of UT molecule ratio in the matrix. It is important to note that although single-stranded DNA probes may adsorb nonspecifically on methyl-terminated SAMs [35], their contribution to fluorescence image contrast is deducted due to the close dye-to-Au distance

Anchoring of a dye precursor on NiO(001) studied by non-contact atomic force microscopy

• Sara Freund,
• Antoine Hinaut,
• Nathalie Marinakis,
• Edwin C. Constable,
• Ernst Meyer,
• Catherine E. Housecroft and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2018, 9, 242–249, doi:10.3762/bjnano.9.26

• bright protrusions have been assigned to O atoms when imaged with a metallic tip [35][36][37][39][41]. This interpretation is supported by calculations for a quite similar metal/metal-oxide system [53], or for the image contrast in AFM measurements on the NiO(001) surface, predicting a stronger

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

• Weijie Zhang,
• Yuhang Chen,
• Xicheng Xia and
• Jiaru Chu

Beilstein J. Nanotechnol. 2017, 8, 2771–2780, doi:10.3762/bjnano.8.276

• amplitude difference, image contrast is another important issue among different materials. In the evaluation, the following contrast metric was employed [30], where A and σ2 are the mean and variance of the amplitude and the subscripts correspond to the PS and LDPE domains. The higher this metric value is

• capability. The contrast magnitudes of the 6th harmonic amplitude and tapping phase images calculated by using Equation 1 are 6.31 and 2.94, respectively. The harmonic amplitude contrast is two-fold larger than the tapping phase contrast. The harmonic image contrast can be further enhanced by tailoring the

• cantilever dynamic spectrum to make the higher-order harmonic frequency and the higher-mode resonance frequency overlap [29]. For instance, the image contrast can be conveniently enhanced up to 6-fold by modifying the cantilever mass distribution [38]. With these optimizations, the amplitude contrast could

Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips

• Sumit Tewari,
• Koen M. Bastiaans,
• Milan P. Allan and
• Jan M. van Ruitenbeek

Beilstein J. Nanotechnol. 2017, 8, 2389–2395, doi:10.3762/bjnano.8.238

• shape with a direct detection technique rather than studying conductance versus tip displacement or STM image contrast. Experimental The experiments were performed in a Unisoku ultra high vacuum (UHV) and low-temperature STM with a base temperature of 2 K. The in-plane (XY) scan range is set by the

Optical techniques for cervical neoplasia detection

• Tatiana Novikova

Beilstein J. Nanotechnol. 2017, 8, 1844–1862, doi:10.3762/bjnano.8.186

• fluorescent from a finite volume and block scattered and out-of-focus light. This increases optical resolution and image contrast compared to conventional optical microscopy. The sample plane is scanned by focused laser beam and confocal images are built up point-by-point. The fluorescence scanning confocal

On the pathway of cellular uptake: new insight into the interaction between the cell membrane and very small nanoparticles

• Claudia Messerschmidt,
• Daniel Hofmann,
• Anja Kroeger,
• Katharina Landfester,
• Volker Mailänder and
• Ingo Lieberwirth

Beilstein J. Nanotechnol. 2016, 7, 1296–1311, doi:10.3762/bjnano.7.121

Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7

• Adam Sweetman,
• Samuel P. Jarvis and
• Mohammad A. Rashid

Beilstein J. Nanotechnol. 2016, 7, 937–945, doi:10.3762/bjnano.7.85

• the tip–sample junction plays in explaining the image contrast, they do not necessarily reveal the origin of the features. Beyond the computational simplicity of the L-J model, an additional advantage compared to more sophisticated modelling techniques is that it is easy to construct “toy” systems

• that allow us to explore how different parts of the surface contribute to the image contrast. A selection of simulated image sequences using this approach is shown in Figure 2, which helps elucidate the origin of the contrast in the simulations shown in Figure 1. The first column shows a control model

In situ observation of deformation processes in nanocrystalline face-centered cubic metals

• Aaron Kobler,
• Christian Brandl,
• Horst Hahn and
• Christian Kübel

Beilstein J. Nanotechnol. 2016, 7, 572–580, doi:10.3762/bjnano.7.50

• even more challenging to uniquely interpret local changes of nanometer-sized grains because of varying image contrast due to bending or tilting of the whole sample as well as lattice (grain) rotation within the sample during testing. The electron-transparent thin films necessary for TEM might also show

Transformations of PTCDA structures on rutile TiO₂ induced by thermal annealing and intermolecular forces

• Szymon Godlewski,
• Jakub S. Prauzner-Bechcicki,
• Thilo Glatzel,
• Ernst Meyer and
• Marek Szymoński

Beilstein J. Nanotechnol. 2015, 6, 1498–1507, doi:10.3762/bjnano.6.155

• on the TiO2(110) surface (a); (b) magnified image showing the position of the PTCDA molecule relative to the surface rows; for clarity, the image contrast inside the rectangle is adjusted to improve the visibility of surface reconstruction rows, and a single molecule STM image (two lobes) is marked

Scanning reflection ion microscopy in a helium ion microscope

• Yuri V. Petrov and
• Oleg F. Vyvenko

Beilstein J. Nanotechnol. 2015, 6, 1125–1137, doi:10.3762/bjnano.6.114

• microscope (HIM). The reflected ions were detected by their “conversion” to secondary electrons on a platinum surface. An angle of incidence in the range 5–10° was used in the experimental setup. It was shown that the RIM image contrast was determined mostly by surface morphology but not by the atomic

• configuration of a sample holder developed for RIM and demonstrate first results obtained for standard test samples. In the discussion part a simple theoretical treatment of the image contrast formation in RIM is provided, which is necessary to obtain quantitative information from RIM images. Experimental All

• opposite side, the primary beam does not reach the surface and, accordingly, no RI signal can be obtained. In the vicinity of a sharp edge of a feature the ion transmission may contribute to the image contrast formation. As was demonstrated in Figure 4a, a bright contrast was observed in the downward step

Nanoporous Ge thin film production combining Ge sputtering and dopant implantation

• Jacques Perrin Toinin,
• Alain Portavoce,
• Khalid Hoummada,
• Michaël Texier,
• Maxime Bertoglio,
• Sandrine Bernardini,
• Marco Abbarchi and
• Lee Chow

Beilstein J. Nanotechnol. 2015, 6, 336–342, doi:10.3762/bjnano.6.32

• annealing, leaving deep holes in the Ge film. The image contrast is affected by the variation of both local diffraction conditions and absorption. The moiré pattern visible in various areas of the deposited layer confirms its polycrystalline structure. The pores are difficult to observe in the cross

• ) placed within the objective lens for capturing high-resolution images. In this mode, the image contrast is mainly affected by topographic variations allowing the presence of holes and asperities at the sample surface to be evidenced. The lateral size and the density were analyzed manually from the SEM